Spectroscopic Ellipsometry: Practical Application to Thin Film Characterization (Materials and Analysis Collection)

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Spectroscopic Ellipsometry: Practical Application to Thin Film Characterization (Materials and Analysis Collection)

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Spectroscopic Ellipsometry: Practical Application to Thin Film Characterization (Materials and Analysis Collection)

Product specifications

Brand Momentum Press
EAN
  • 9781606507278
  • 9780470016084
Material
  • Na
Color
  • Na
Size
  • 22.9 x 15.2 x 1 centimetres (0.2
  • NA
  • One Size

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