System on Chip Test Architectures: Nanometer Design for Testability: Volume . (Systems Silicon, .)

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Pages: 896, Edition: 1, Hardcover, Morgan Kaufmann

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Brand Morgan Kaufmann
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  • 9780123739735

Morgan Kaufmann

System-on-Chip Test Architectures: Nanometer Design for Testability (ISSN)

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VLSI Test Principles and Architectures: Design for Testability (Morgan Kaufmann Series in...

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VLSI Test Principles and Architectures: Design for Testability (Morgan Kaufmann Series in...

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VLSI Test Principles and Architectures: Design for Testability

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