System on Chip Test Architectures: Nanometer Design for Testability: Volume . (Systems Silicon, .)

Prices from
98.21

Sponsored links

COMPARE ALL WEBSHOPS (2)

Description

System on Chip Test Architectures: Nanometer Design for Testability: Volume . (Systems Silicon, .)

Description Description
Product Specifications Product specifications
Related results Related results
Next
Previous

Compare webshops (2)

Sponsored links · Some shops pay us a fee

Sort by:

£ 98.21

£ 98.21

Description (0)

System on Chip Test Architectures: Nanometer Design for Testability: Volume . (Systems Silicon, .)

Product specifications

Brand Morgan Kaufmann
EAN
  • 9780123739735

Morgan Kaufmann

System-on-Chip Test Architectures: Nanometer Design for Testability (ISSN)

£ 49.39
More Information More Info

Morgan Kaufmann

VLSI Test Principles and Architectures: Design for Testability (Morgan Kaufmann Series in...

£ 52.24
More Information More Info

Morgan Kaufmann

VLSI Test Principles and Architectures: Design for Testability (Morgan Kaufmann Series in...

£ 62.46
Compare 2 stores 2 stores

Morgan Kaufmann

VLSI Test Principles and Architectures: Design for Testability

£ 54.99
Compare 2 stores 2 stores
Featured Choice
£ 98.21
To Shop