Through-Wall Imaging and Non-Intrusive Detection Essentials: Applying Radio Frequency Advanced Sensing Technologies to Reveal Hidden Structures Objects

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Pages: 240, Hardcover, Independently published

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MDPI AG

Sensing and Imaging for Defect Detection

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Optical Imaging and Metrology: Advanced Technologies

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Cambridge University Press

Plasmonic Nanoelectronics and Sensing (EuMA High Frequency Technologies Series)

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Cambridge University Press

Plasmonic Nanoelectronics and Sensing (EuMA High Frequency Technologies Series)

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